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By Daniel Chateigner

ISBN-10: 1848211988

ISBN-13: 9781848211988

This ebook introduces and info the major points of mixed research - an x-ray and/or neutron scattering method which mixes structural, textural, tension, microstructural, part, layer, or different correct variable or estate analyses in one method. The textual content begins with uncomplicated theories regarding diffraction through polycrystals and a few of the most typical mixed research instrumental set-ups are exact. additionally mentioned are microstructures of powder diffraction profiles; quantitative part research from the Rietveld research; residual rigidity research for isotropic and anisotropic fabrics; specular x-ray reflectivity, and a number of the linked models.

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Standard samples It is almost impossible to develop several exactly identical samples which would serve the calibration of scattering instruments. ). Two approaches can then be settled to ascertain a given instrumental resolution: – certifying a given sample process which develops samples within given uncertainties and distributions for the parameters to be measured; – circulating the same sample on the instruments to be calibrated and comparing results from different instruments in a “round-robin” manner.

2. Modeling of a powder diffraction pattern Depending on the information saught and on the a priori knowledge of the material, we can use one of the two methodologies given hereafter, or the Rietveld approach (see the following section). 1. Decomposition of the diagram (individual adjustment of the peaks) The principle of this method, called direct integration, is to adjust an analytical function on each of the peaks of the pattern, provided the individual contributions do not overlap too much.

39] 28 Combined Analysis directly shows that we have to increase the number of counts to reach the best precision. In this aim it is usual to express the integration range of a given peak in terms of its FWHM. Considering a Gaussian distribution for instance, with an integration range HP = 2H, we integrate nearly 98% of the total number of counts reaching close to the best precision. However, such integration ranges are often increased, in particular when line broadening occurs. 3. Detection limit Peak intensities are rapidly reaching background level, and the question of a reasonable limit of integration raises.

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Combined Analysis by Daniel Chateigner


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